Abstract:
A series of field experiments were conducted to verify
the effects of roughness on passive microwave emission. From
these field experiments, it was observed that surface roughness
increases observed brightness temperatures (higher emissivity) at
horizontal polarization while diminishing the vertically polarized
brightness temperatures marginally.
The advanced integral equation method (AIEM) and QP models
were found to model the effects of surface roughness fairly
reasonably. The QP model which is a parameterized version of
the AIEM was found to show correspondence with the AIEM
simulations and is therefore recommended for application in
AMSR based data assimilation schemes.